Memory Card Reliability
 
The reliability of a memory card varies depending if being a standard or a high performance memory card. The standard of the memory card does not matter since all memory cards are based on the same flash memory technology. The reliability of a memory card can be measured by the following parameters:

Cell Endurance/Write and Erase Cycles: Cell endurance is characterised by how many times data can be written and erased from a memory card. A Multi-Level Cell memory card has in general at least 10 000 write and erase cycles. A Single-Level Cell memory card has in general at least 100 000 Write and Erase Cycles. Some memory card manufactures are claiming up to 250 000 write and erase cycles. 10 000 write and erase cycles can also be translated to that you can write and erase the entire content of the memory card once per day for 27 years.

Data Retention Time: The time a memory card can retain data, even called for the memory card’s operational life time. Under normal circumstances and normal use the data retention time for a memory card is at least 10 years. Some memory card manufactures are claiming up to 100 years of usage life.

The above test results are referring to the reliability of a high performance card. For finding the exact reliability of a specific memory card we recommend you to check each manufacture’s technical specifications.

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